Bruker Announces New Analytical Solutions for Nanoanalysis, Microscopy and Advanced Materials Research Markets
ATLANTA, CA: Bruker, a provider of business supplies and equipment solutions, announces its set of new analytical solutions for the nanoanalysis, microscopy and advanced materials research markets. These solutions also include aftermarket services and life-cycle support solutions for its customers.
Nanoanalysis, Microscopy & Advanced Materials Research
The new Bruker SiBrickScan (SBS) is the first at-line FTIR instrument allowing for the quantification of interstitial Oxygen in complete Silicon bricks and ingots. In contrast to classical approaches, the SBS does not require the preparation of thin samples, but directly determines the Oxygen gradient along the ingot main axis and for fast and economic QC.
The micro-XRF spectrometer M4 TORNADO offers new key capabilities for the analysis of multilayer materials as well as for the quantification at uneven surfaces, e.g. in powder samples. The new XMethod software 1.3 manages calibrations and standards and enables the optimization of complex methods, such as the quantitative analysis of metallic multilayer stacks for composition and coating thickness. The M4 TORNADO’s new FlexiSpot feature allows spot sizes of up to 200 µm forreproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.
The new Vutara 352 Super-Resolution Fluorescence Microscope enables entirely new research functionality in super-resolution microscopy, including the ability to perform pair-correlation, co-location, cluster, and live-cell analysis with super resolution. Based on Bruker’s proprietary biplane technology, it leverages high-performance data acquisition and image processing capabilities to perform the entire imaging workflow. The Opterra SR high speed confocal option on the Vutara 352 system enables seamless correlative imaging for sample investigation prior to super-resolution imaging, as well as the capability to combine super-resolution images with confocal images for contextual information.
The new MultiMode 8-HR AFM (Atomic Force Microscope) brings extensive capabilities for nanomechanics and higher speed imaging to AFMs. It enables researchers to access the broadest range of ramp frequencies for viscoelastic studies and nanomechanical assessment of a wide range of materials, from soft biological specimens to hard metallic samples.
The novel Contour CMM Dimensional Analysis System is the world’s first non-contact metrology system to perform simultaneous nanoscale height, surface texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing, all on one instrument. Its Vision Dimensions software offers proprietary features designed for small-part characterization, including automation for part programs, hundreds of preset analyses, and customized inspection reports. The Contour CMM system performs rapid, non-contact precision measurements for stringent metrology in R&D and manufacturing of small structures in precision-machined components.
After-Market Services and Life-Cycle Support
LabScape – Magnetic Resonance & Preclinical Imaging Service and Life Cycle Support: The Bruker BioSpin Group introduces a new, flexible approach to instrument life-cycle management, maintenance and service - the new LabScape concept. Bruker BioSpin’s LabScape suite of laboratory services includes a range of maintenance, repair and upgrade agreements for magnetic resonance and preclinical imaging product lines.